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A 1000V, 120A nondestructive reserve bias second breakdown tester for bipolar power transistors

By Lee, F. C.

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Book Id: WPLBN0002207734
Format Type: PDF eBook :
File Size: 1.4 MB
Reproduction Date: 2012
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Title: A 1000V, 120A nondestructive reserve bias second breakdown tester for bipolar power transistors  
Author: Lee, F. C.
Volume:
Language: English
Subject: BOUNDARY LAYER CONTROL, FLOW DISTRIBUTION, FLOW VELOCITY
Collections: NASA Publication Collection
Historic
Publication Date:
1985
Publisher:

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C, L. F., G, C., & Y, C. D. (1985). A 1000V, 120A nondestructive reserve bias second breakdown tester for bipolar power transistors. Retrieved from http://www.netlibrary.net/


Description
Supplemental catalog subcollection information: NASA Publication Collection; Astrophysics and Technical Documents

Summary
Contributor: National Aeronautics and Space Administration (NASA). The digitalization of this book was sponsored by National Aeronautics and Space Administration (NASA); Additional Subject Descriptions: BOUNDARY LAYER CONTROL; FLOW DISTRIBUTION; FLOW VELOCITY; DIFFUSION; INLET FLOW; SUCTION; NACELLES; VERTICAL TAKEOFF AIRCRAFT

 

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